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| Mfg Part Number: 1N5597-1 4 STUD | Alternate P/N: 1N559714STUD | NSN : 5961-00-011-9482 |
| NIIN : 000119482 | CAGE Code : 07688 | Manufacturer: Joint Electron Device Engineering |
| Item Name : Semiconductor Devic | FSC : 5961 Semiconductor Devices and Associated Hardware |
Aviation Gamut, owned and operated by ASAP Semiconductor, is an all-inclusive purchasing platform for hard-to-find and in-demand parts 1N5597-1 4 STUD and components pertaining to the civil aviation, defense, aerospace, industrial, and electronic markets. An NSN is a 13-digit numeric code that serves to identify 'standardized material items of supply' as they have been recognized by all NATO countries and the United States Department of Defense. As such, we have an inventory of more than two billion new and obsolete parts, among which is an unparalleled selection of NSN parts and much more. This includes items such as Semiconductor Devic 1N5597-1 4 STUD from manufacturer Joint Electron Device Engineering and many more, all of which are available with short lead times and competitive prices. For NSN parts, Aviation Gamut is the ultimate source.
Our website offers a number of parametric search capabilities, one of which allows you to search specifically for 1N5597-1 4 STUD. This means you can quickly sort through National Stock Numbers such as 5961000119482 and find parts from quality manufacturers like Joint Electron Device Engineering and many others. To begin the purchasing process immediately, submit an RFQ today. Our team of dedicated account managers is standing by and will respond to all inquiries in 15 minutes or less.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-00-011-9482 Item Description: Semiconductor Devic | 5961 | 000119482 | 0 | N | A | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | A | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 1n5597-1 4 Stud | 1 | 1 | C | A |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | METAL |
| ABHP | OVERALL LENGTH | 0.347 INCHES MAXIMUM |
| ADAV | OVERALL DIAMETER | 1.950 INCHES MAXIMUM |
| AXGY | MOUNTING METHOD | THREADED STUD AND THREADED HOLE |
| CQJX | NOMINAL THREAD SIZE | 0.250 INCHES |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 10000.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION |
| TEST | TEST DATA DOCUMENT | 037Z3-03021 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWIN |
| THSD | THREAD SERIES DESIGNATOR | UNF |
| TTQY | TERMINAL TYPE AND QUANTITY | 1 THREADED HOLE AND 1 THREADED STUD |
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